By W. Richard Bowen

This is the 1st publication to compile either the elemental idea and confirmed procedure engineering perform of AFM. it really is provided in a manner that's obtainable and necessary to practicing engineers in addition to to those that are enhancing their AFM talents and data, and to researchers who're constructing new items and recommendations utilizing AFM.

The booklet takes a rigorous and functional process that guarantees it really is without delay appropriate to technique engineering difficulties. basics and strategies are concisely defined, whereas particular advantages for technique engineering are in actual fact outlined and illustrated. Key content material comprises: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the improvement of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.

  • Atomic strength microscopy (AFM) is a vital device for strategy engineers and scientists because it permits greater strategies and products
  • The merely ebook facing the idea and functional purposes of atomic strength microscopy in procedure engineering
  • Provides best-practice suggestions and adventure on utilizing AFM for procedure and product improvement

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Additional info for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products

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P. , Organic and inorganic contamination on commercial AFM cantilevers, Langmuir 15 (1999) 6522–6526. W. J. F. Davis, Wet chemical processing of (0001)Si 6H-SiC hydrophobic and hydrophilic surfaces, J. Electrochem. Soc. 146 (5) (1999) 1910– 1917. A. G. H. Theopold, Piranha solution explosion, Chem. Eng. News 68 (17) (1990) 2. V. Erickson, Piranha solution explosions, Chem. Eng. News 68 (33) (1990) 2. [47] T. Arai, M. Tomitori, Removal of contamination and oxide layers from UHV-AFM tips, Appl. Phys.

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