By Peter W. Hawkes
Advances in Imaging & Electron Physics merges long-running serials―Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The sequence positive factors prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, snapshot technology and electronic photo processing, electromagnetic wave propagation, electron microscopy, and the computing tools utilized in a majority of these domains.
- Contributions from major professionals
- Informs and updates on all of the most up-to-date advancements within the field
Read Online or Download Advances in imaging and electron physics. Volume 183 PDF
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Extra resources for Advances in imaging and electron physics. Volume 183
Note that there are significant changes in dm upon cleaning our samples. The results of Bronshtein and Fraiman (1969) for dm show an increasing trend across the transition 20 Mohamed M. El-Gomati and Christopher G. H. Walker SE Yield 2 1 SE Yield 0 2 SE Yield SE Yield (c) 1 0 2 (d) 1 0 2 SE Yield (b) 1 0 2 (e) 1 0 6 WF eV (a) (f) 4 2 0 0 20 40 Z 60 80 100 Figure 10 dm versus atomic number Z. (a) York data El Gomati et al. (2008) (cleaned); (b) York data El Gomati et al. (2008) (as-inserted); (c) Bronshtein and Fraiman (1969); (d) Ding, Tang, and Shimizu (2001) using Eq.
THE INFLUENCE OF ERRORS IN THE ELASTIC AND INELASTIC PROPERTIES ON THE MONTE CARLO CALCULATIONS There are known to be considerable errors in the values of both the elastic scattering cross section and the stopping power for all elements ( Jablonski, Salvat, & Powell 2002; Jablonski, Tanuma, & Powell 2006). It is, therefore, important to understand how the errors in these parameters inﬂuence the backscattering coefﬁcient. In these experiments, we used the York MC program mentioned previously with the expression for stopping power used by Joy and Luo (1989) and the NIST elastic scattering cross sections ( Jablonski, Salvat, & Powell 2002).
Greenwood, J. , & Roberts, R. H. (1994). Atomic number dependence of the secondary electron cascade from solids. Phys. Rev B, 49, 12486–12495. Harris, L. A. (1968). Analysis of materials by electron-excited Auger electrons. Journal of Applied Physics, 39, 1419–1427. , & Gauvin, R. (1997). CASINO: A new Monte Carlo Code in C language for electron beam interactions. Part I: Description of the program. Scanning, 19, 1–14. , & Powell, C. J. (2002). 1. National Institute of Standards and Technology.
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